Drive-level capacitance profiling (DLCP) is a type of capacitance–voltage-profiling characterization technique developed specifically for amorphous and polycrystalline materials, which have more anomalies such as deep levels, interface states, or non-uniformities.
Whereas in standard C–V profiles the charge response is assumed to be linear (dQ = CdV), in DLCP profiles the charge response is expected to have significant non-linear behavior (dQ = C0dV + C1(dV)2 + C2(dV)3) due to the significant larger AC-signal amplitude used in the DLCP technique.
DLCP can yield, like admittance spectroscopy, both the spatial and the energetic distribution of defects.
DLCP is a strictly dynamic measurement, meaning that the steady-state behavior recorded in a C–V profile is discarded.
"Bulk and MetaStable Defects in CuIn(1-x)Ga(x)Se2 Thin Films Using Drive Level Capacitance Profiling."