Angus Ian Kirkland FInstP FRSC FRMS (born August 1965)[2][non-primary source needed] is the JEOL Professor of Electron Microscopy at the Department of Materials, University of Oxford.
[4][5] Kirkland completed a Master of Arts in Natural Sciences, and a Doctor of Philosophy at the University of Cambridge in 1989.
[6][7] Kirkland continued at Cavendish Laboratory as post-doctoral fellow until he became Senior Research Associate.
[10][9] Kirkland research focuses on developing new quantitative techniques for ultra high-resolution electron microscopy, and new imaging detectors.
[25][26] In 2012, Kirkland was appointed as an Honorary Professor at the centre of HRTEM, Nelson Mandela University, South Africa.