David J. Weiss is an American psychometrician who has made significant contributions to the field of psychometrics.
Alongside Fredric M. Lord, Weiss is considered a pioneer in the development and application of computerized adaptive testing[1] Weiss earned his bachelor's degree in psychology from the University of Pennsylvania in 1959.
Thereafter, he pursued doctoral studies in the subject at the University of Minnesota, graduating in 1963.
[2] After earning his doctorate, he remained and joined the faculty of the University of Minnesota.
[3] Weiss is the founding editor-in-chief of the academic journal Applied Psychological Measurement, serving from January 1977 to December 2001.