Hideo Fujiwara (藤原 秀雄, Fujiwara Hideo) is a Japanese computer scientist[7] who made significant contributions to ATPG (automatic test pattern generation) algorithms.
[9] As one of his works, he invented the FAN algorithm in 1983,[8] which was the fastest ATPG algorithm at that time, and was adopted by industry.
[10] He was born in Nara, Japan, and studied electronic engineering at Osaka University, where he received his B.E.
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