Irith Pomeranz (Hebrew: אירית פומרנץ) is an Israeli electrical engineer known for her research in circuit testing and fault tolerance.
[2] Her dissertation, Fault Detection in Digital Circuits, was supervised by Zvi Kohavi.
[3] After completing her doctorate, she became a lecturer at the Technion, and then in 1990 an assistant professor of electrical and computer engineering at the University of Iowa.
[4] In 1999, Pomeranz was elected as a Fellow of the IEEE "for contributions to the area of test generation for digital logic circuits".
[5][6] In 2016, the International Test Conference selected one of her papers, "Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Design", as "the most significant paper published ten years before".