His research program includes the development of novel X-ray probes and the characterization of surface, interface, and thin-film structures with atomic resolution.
The latter have greatly enhanced chemical and structural sensitivity for studying systems as dilute as one-hundredth of an atomic monolayer.
He also developed a number of methods for generating X-ray standing waves with differing characteristic length scales.
He uses these periodic X-ray probes to pinpoint the lattice location of adsorbate atoms on crystalline surfaces, to measure strain within epitaxially grown semiconductor and ferroelectric thin films, and to locate heavy atoms within ordered ultrathin organic films.
His PhD thesis was titled "X-ray standing wave analysis for bromine chemisorbed on silicon.