Also, D. Bradley, J. Higgins, M. Key, and S. Majumdar realized a TLP-based laser-triggered spark gap for kilovolt pulses of accurately variable timing in 1969.
For investigation of ESD and electrical-overstress (EOS) effects a measurement system using a TLP generator has been introduced first by T. Maloney and N. Khurana in 1985.
The TLP technique is based on charging a long, floating cable to a pre-determined voltage, and discharging it into a Device-Under-Test (DUT).
Since then, other commercial systems have been developed (e.g., by Thermo Fisher Scientific, Grundtech, ESDEMC Technology, High Power Pulse Instruments, Hanwa, TLPsol).
Pioneered by academia (University of Illinois) and commercialized by Barth Electronics, VF-TLP has become an important ESD analysis tool for analyzing modern high-speed semiconductor circuits.