Several recording and processing schemes have been developed to assess optical wave characteristics such as amplitude, phase, and polarization state, which make digital holography a very powerful method for metrology applications .
Yet, this configuration can also be used in conjunction with temporal modulation methods, such as phase-shifting and frequency-shifting for high sensitivity measurements in low light.
These holograms contain amplitude and phase information of the optical radiation diffracted by the object, in the sensor plane.
[7] Addressing simultaneously distinct domains of the temporal and spatial bandwidth of holograms was performed with success for angular,[8] wavelength,[9][10] space-division,[11] polarization,[12] and sideband [13][14] multiplexing schemes.
[15] Super-resolution is possible by means of a dynamic phase diffraction grating for increasing synthetically the aperture of the CCD array.