Geometric phase analysis is a method of digital signal processing used to determine crystallographic quantities such as d-spacing or strain from high-resolution transmission electron microscope images.
In geometric phase analysis, local changes in the periodicity of a high resolution image of a crystalline material are quantified, resulting in a two-dimensional map.
Quantities which can be mapped with geometric phase analysis include interplanar distances (d-spacing), two-dimensional deformation and strain tensors and displacement vectors.
Together with a vector of one crystallographic plane depicted in the image, the amplitude and phase can be used to generate a 2D map of d-spacing.
Secondly, a vector of crystallographic plane is an important input parameter and the analysis is sensitive to the accuracy of its localization.