The Academic Aptitude Test[1] (AAT; 學業能力測驗) is a test conducted by the Hong Kong Education Department from 1978 to 2000 in conjunction with the Secondary School Place Allocation System.
The candidates of the test were students studying in the sixth grade of primary schools.
The test was designed to create a common ground in measuring different school systems and began in 1978 as part of the Secondary School Places Allocation (SSPA) scheme.
HKAAT aimed to test student logic, reasoning, and classification ability.
This Hong Kong education topic article is a stub.