John M. Butler (born April 1, 1969) is a scientist and expert on forensic DNA profiling.
[1] Butler received his bachelor's degree in Chemistry from Brigham Young University.
From 1993-1995, he worked as a visiting scientist at the Federal Bureau of Investigation and earned his Ph.D. in Analytical chemistry from the University of Virginia in 1995.
[2] After a first employment as postdoctoral fellow at the National Institute of Standards and Technology for two years, he continued to work 1997-1999 as a staff scientist for the start-up company GeneTrace Systems Inc.[3] using time-of-flight mass spectrometry for the separation of short tandem repeat markers.
[6] Butler has written several widely recognized textbooks on forensic DNA profiling [7] [8] [9] [10] [11] covering all aspects of the underlying molecular genetic methods, the application to forensic casework and the biostatistical interpretation of results.