The device being probed must be electrically stimulated using a repeating test pattern, with a trigger pulse provided to the LVP as reference.
The LVP uses dual infrared (IR) lasers to perform both device imaging and waveform acquisition.
On an electrically active device, the instrument monitors the changes in the phase of the electromagnetic field surrounding a signal being applied to a junction.
The instrument obtains voltage waveform and timing information by monitoring the interaction of laser light with the changes in the electric field across a p-n junction.
The changing electromagnetic field at the junction affects the amount of laser light that is reflected back.