Specifically, in the field of image analysis, it gives a measure of the noise of an imaging system, and thus yields one assessment of its performance.
An operator, using computer software, defines an arbitrary area, with a given set of data points, within the signal and background regions of the output image of the infrared sensor, i.e. of the unit under test (UUT), (see "Half Moon" image below).
A second order polynomial curve is fitted to the data of each line.
The signal input of the UUT is within its own spectral response.
The slope of the linear portion of this curve is then found using the method of least squares.
All the data points in the linear region of the SiTF curve can be used in the method of least squares to find a linear approximation.