X-ray scattering techniques

X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films.

These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.

However, both scattering and diffraction are related general phenomena and the distinction has not always existed.

In IXS the energy and angle of inelastically scattered X-rays are monitored, giving the dynamic structure factor

In practice X-rays with small energy transfers are included with the diffraction spots due to elastic scattering, and X-rays with large energy transfers contribute to the background noise in the diffraction pattern.

This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.
Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering (IXS).