In an integrated CLEM system, the sample is imaged using an electron beam and an optical light path simultaneously.
Integrated CLEM is thus considered to be beneficial because the methodology is quicker and easier, and it reduces the chance of changes in the sample during the process of data collection.
Overlay of the two images is thus performed automatically as a result of the integration of two microscopes.
Different fluorescent labels can be used in order to highlight multiple regions of interest in the sample.
[2] Recently Kumar et al. [3] combined FRET based molecular tension measurements[4] with cryo-electron microscopy to study how force on talin (a focal adhesion protein which directly links integrins to actin) is related to actin organization.