Edward B. Eichelberger (born February 8, 1934, in Norfolk, VA) is an American engineer and wrestler.
[1] Eichelberger shared with Thomas W. Williams (engineer) the 1989 IEEE Computer Society W. Wallace McDowell Award[1] “for developing the level-sensitive scan technique of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.” In 2000, Eichelberger received the IEEE Test Technology Technical Council's Lifetime Contribution Medal.
[3] As a wrestler, Eichelberger won three state championships for Granby High School.
[4] In 1973, he was honored by the IBM Outstanding Contribution Award for the level-sensitive scan design (LSSD) technique.
[5] His development of Weighted Random Patterns[6] was recognized with the IBM Outstanding Innovation Award.