Thomas W. Williams (born August 3, 1943) was an American engineer, Chief Scientist and fellow at Synopsys.
[1] He worked as a manager of the VLSI Design for Testability group at the IBM Microelectronics Division in Boulder, Colorado.
Williams chaired the IEEE technical subcommittee on design for testability and has been a keynote and invited speaker at international conferences.
Williams was named a fellow of the Institute of Electrical and Electronics Engineers in 1988 “for leadership and contributions to the area of design for testability.”[3] In 1989 Williams shared with Edward B. Eichelberger the 1989 IEEE Computer Society W. Wallace McDowell Award[2] “for developing the level-sensitive scan technique of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.” In 2007, Williams received the European Design and Automation Association (EDAA) Lifetime Achievement Award[1] for outstanding contributions to the state of the art in electronic design, automation and testing of electronic systems.
In 2010, Williams was the recipient of the IEEE Test Technology Technical Council Lifetime Contribution Medal.