Jacob Savir is a professor in the Department of Electrical and Computer Engineering[1] at the New Jersey Institute of Technology and an IEEE Fellow.
in Electrical Engineering from Technion – Israel Institute of Technology in 1968 and 1974 respectively.
He then obtained his MS in Statistics and PhD in Electrical Engineering from Stanford University in 1976 and 1978 respectively.
He worked as a researcher at IBM for nearly two decades after his PhD (1978-1996).
In 1994, he co-authored the paper on Broad-side delay test.