Fault model

From the model, the designer or user can then predict the consequences of this particular fault.

It is possible that two or more faults produce same faulty behavior for all input patterns.

In this case, much less than k×n fault tests are required for a circuit with n signal line.

[3] In the example, a NAND gate has been shown, the set of all input values that can test output's SA0 is {00,01,10}.

[5] A fault model in an aerospace context is a set of structured information which helps users or systems to identify and isolate a problem that occurs on an engine, line-replaceable unit (LRU), or auxiliary power unit (APU) during a flight.