Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).
Electrical characterization can be used to determine resistivity, carrier concentration, mobility, contact resistance, barrier height, depletion width, oxide charge, interface states, carrier lifetimes, and deep level impurities.
Many of these techniques have been perfected for silicon, making it the most studied semiconductor material.
As other fields such as power electronics, LED devices, and photovoltaics develop, characterization of a variety of alternative materials (including organic semiconductors will continue to increase in importance.
Many existing characterization methods will need to be adapted to accommodate the peculiarities of these new materials.